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Scanning electron microscopy and x-ray microanalysis

By: Goldstein, Joseph Contributor(s): Newbury, Dale/Joy, David/Lyman, Charles/Echlin, Patrick/Lifshin, Eric/Sawyer, Linda/Michael, Joseph Material type: Text

TextLanguage: English Publication details: New York Springer 2003Edition: 3rdDescription: 690ISBN: 9780306472923Subject(s): PhysicsDDC classification: 502.825 GOL

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Current library	Call number	Status	Date due	Barcode	Item holds
Doon University	502.825 GOL (Browse shelf (Opens below))	Available		16200

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