Goldstein, Joseph <br/><br/>
Scanning electron microscopy and x-ray microanalysis 

 - 3rd 
 - New York  Springer  2003 
 - 690 
<br/><br/><label>ISBN: </label>9780306472923 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Physics
<br/><br/><label>Dewey Class. No.: </label>502.825  GOL