Scanning electron microscopy and x-ray microanalysis
Material type:
TextLanguage: English Publication details: Springer New York 2003Edition: 3rdDescription: 690ISBN: - 9780306472923
- 502.825 GOL
Books
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Doon University | 502.825 GOL (Browse shelf(Opens below)) | Available | 16200 |
Total holds: 0
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